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Literature Review on High Frequency Affects and Methodologies in Reduction of EM Interference and IR Drop in VLSI Circuits
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Abstract: This paper presents the literature review on electromagnetic interference, and power leakage minimization. To reduces the EM interference and IR drop by using various methodologies applied by researchers. For any research work or in an effort to introduce certain novelty in existing systems, the analysis and study of existing approaches, systems and algorithms is of great significance. In fact, the review of existing systems can be stated to be the foundation for a novel research. Thus, taking into consideration of these requirements to examine and study varies literatures available for the impact of my work carried out on Electromagnetic interference on VLSI and IR drop, power dissipation and performance of chip, in this paper a number of literatures have been studied and analyzed.
Keywords: EMI, EMC, IR drop, SOC, VLSI, Ldi/dt, CMOS, DSM.
Keywords: EMI, EMC, IR drop, SOC, VLSI, Ldi/dt, CMOS, DSM.
How to Cite:
[1] MLN. Acharyulu, N.S. Murthysarma, K. Lal kishore, βLiterature Review on High Frequency Affects and Methodologies in Reduction of EM Interference and IR Drop in VLSI Circuits,β International Journal of Innovative Research in Electrical, Electronics, Instrumentation and Control Engineering (IJIREEICE), DOI: 10.17148/IJIREEICE.2016.45112
