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International Journal of Innovative Research in Electrical, Electronics, Instrumentation and Control Engineering
International Journal of Innovative Research in Electrical, Electronics, Instrumentation and Control Engineering A monthly Peer-reviewed & Refereed journal
ISSN Online 2321-2004ISSN Print 2321-5526Since 2013
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← Back to VOLUME 4, ISSUE 3, MARCH 2016

Detection of Artifacts in Visual Evoked Potentials

G. Hemalatha, Dr. B. Anuradha

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Abstract: The aim of this work is to introduce correlation test to detect artifacts in visual evoked potentials. If an artifact occurs a sample signal deviates from the ensemble average. In this paper signals with less correlation coefficient are considered as artifacts and are removed from the further analysis. An attempt has been made to apply these techniques to 14 -channel visual evoked potentials (VEPs) obtained from different subjects.

Keywords: evoked potentials, ensemble average, and correlation.

How to Cite:

[1] G. Hemalatha, Dr. B. Anuradha, β€œDetection of Artifacts in Visual Evoked Potentials,” International Journal of Innovative Research in Electrical, Electronics, Instrumentation and Control Engineering (IJIREEICE), DOI: 10.17148/IJIREEICE.2016.4342

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