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International Journal of Innovative Research in Electrical, Electronics, Instrumentation and Control Engineering
International Journal of Innovative Research in Electrical, Electronics, Instrumentation and Control Engineering A monthly Peer-reviewed & Refereed journal
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Automation of FMET & Regression Tests for Doser After-Treatment Controls using Load-box User-Interface-System Hardware-In-Loop Bench

Priya Malani, Chidambar Rao Bhukya, Jagdish Vishwasrao, Jayesh Sonkusare

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Abstract: Hardware–in-loop (HIL) simulation is a technique which allows the development and testing of Electronic Control Module (ECM) virtually in the real time domain in order to analyse or overlook the behaviour & performance of various sensors and actuators/loads present inside the Doser. Testing done by using the HIL approach reduces the overall cost, manual efforts and overall testing time as compared to manual testing to a greater extent. This paper describes the case study to automate the Failure Mode Effects Tests (FMET) and Regression Tests of Doser System where a HIL technique is invoked for the authentication and affirmation of the performance of the Doser. The system is developed by using Load-Box User Interface System (LUIS) hardware and Digital FMET box which auto-simulate fault conditions for various sensors like Pump Unit Temperature Sensor, Mixed Air Pressure Sensor, NOx sensor, Selective Catalyst Reduction Inlet (SCR) Temperature Sensor and actuators like Internal Metering Valve (IMV), Bypass Valve (BPV), Air Shutoff Valve (ASOV). The conventional manual FMET testing is time-consuming and prone to various manual errors. Thus to reduce the time and manual errors and to increase the overall efficiency the fully automated test bench is developed. The test bench uses National Instruments (NI) Test stand for writing test sequence scripts to fully automate the manual FMET and regression tests. The developed automated test bench deliver faster test results with reduced manual errors, reduced man power and improved cost saving.

Keywords: After-Treatment System, Hardware-In-Loop (HIL) Testing, Load Box User Interface System (LUIS), Digital FMET Box, FMET, Regression Tests.

How to Cite:

[1] Priya Malani, Chidambar Rao Bhukya, Jagdish Vishwasrao, Jayesh Sonkusare, “Automation of FMET & Regression Tests for Doser After-Treatment Controls using Load-box User-Interface-System Hardware-In-Loop Bench,” International Journal of Innovative Research in Electrical, Electronics, Instrumentation and Control Engineering (IJIREEICE), DOI: 10.17148/IJIREEICE.2017.5527

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