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International Journal of Innovative Research in Electrical, Electronics, Instrumentation and Control Engineering
International Journal of Innovative Research in Electrical, Electronics, Instrumentation and Control Engineering A monthly Peer-reviewed & Refereed journal
ISSN Online 2321-2004ISSN Print 2321-5526Since 2013
IJIREEICE meets the suggestive parameters outlined in the latest University Grants Commission (UGC) for peer-reviewed journals, ensuring high standards of research integrity, publication ethics, and academic excellence.
← Back to VOLUME 7, ISSUE 8, AUGUST 2019

Simulative Investigation of Plant Diseases using KNN Algorithm

Dr. Pankaj Mohindru, Gagandeep Kaur, Dr. Pooja

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Abstract: Crop cultivation plays an essential role in the agricultural field. Presently, the loss of food is mainly due to infected crops, which reflexively reduces the production rate. To identify the plant diseases at an untimely phase is not yet explored. The main challenge is to reduce the usage of pesticides in the agricultural field and to increase the quality and quantity of the production rate. Our paper is used to explore the leaf disease prediction at an untimely action using KNN algorithm. A colour based segmentation model is defined to segment the infected region and placing it to its relevant classes. Experimental analyses were done on samples images in terms of time complexity and the area of infected region. Plant diseases can be detected by image processing technique. Disease detection involves steps like image acquisition, image pre-processing, image segmentation, feature extraction and classification. Our project is used to detect the plant diseases and provide solutions to recover from the disease. It shows the affected part of the leaf in percentage.

Keywords: Plant Leaf Image Samples, Image Recognition, Artificial Neural Network, KNN, SVM

How to Cite:

[1] Dr. Pankaj Mohindru, Gagandeep Kaur, Dr. Pooja, β€œSimulative Investigation of Plant Diseases using KNN Algorithm,” International Journal of Innovative Research in Electrical, Electronics, Instrumentation and Control Engineering (IJIREEICE), DOI: 10.17148/IJIREEICE.2019.7805

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