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International Journal of Innovative Research in Electrical, Electronics, Instrumentation and Control Engineering
International Journal of Innovative Research in Electrical, Electronics, Instrumentation and Control Engineering A monthly Peer-reviewed & Refereed journal
ISSN Online 2321-2004ISSN Print 2321-5526Since 2013
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Machine Learning for Detection and Classification of Fetal Brain Abnormalities: A Review

Seethal Sasindran, P.Nandakumar

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Abstract: Machine learning is an powerful tool that allow the computers to learn automatically without human assistance. It can be applied for medical images to help physicians in rendering medical diagnoses. Since human brain is one of the most complex and sophisticated organ in human body, study of it’s structure, function and disease is important. The development of the brain begins at the first few weeks after conception. Brain development is adversely affected by preterm birth. As approximately 3 in 1000 women are pregnant with a fetal of abnormal brain, detecting and classifying fetal brain abnormalities is important. Machine learning is a very good approach and can be used for early detection of fetal brain abnormalities, thus we can improve the quality of diagnosis and treatment planning. I present an detailed review of machine learning techniques applied for the detection and classification of fetal brain abnormalities.

Keywords: Fetal brain, Machine learning, Random forest classifier, SVM

How to Cite:

[1] Seethal Sasindran, P.Nandakumar, β€œMachine Learning for Detection and Classification of Fetal Brain Abnormalities: A Review,” International Journal of Innovative Research in Electrical, Electronics, Instrumentation and Control Engineering (IJIREEICE)

Creative Commons License This work is licensed under a Creative Commons Attribution 4.0 International License.