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International Journal of Innovative Research in Electrical, Electronics, Instrumentation and Control Engineering
International Journal of Innovative Research in Electrical, Electronics, Instrumentation and Control Engineering A monthly Peer-reviewed & Refereed journal
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← Back to VOLUME 12, ISSUE 5, MAY 2024

Crop Yield Prediction Using CNN

Prof. Krishna S. Kadam

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Abstract: Crop yields are critically dependent on weather. A growing empirical literature models this relationship in order to project climate change impacts on the sector. We describe an approach to yield modeling that uses a semi parametric variant of a deep neural network, which can simultaneously account for complex nonlinear relationships in high-dimensional datasets, as well as known parametric structure and unobserved cross-sectional heterogeneity. Using data on corn yield from the US Midwest, we show that this approach outperforms both classical statistical methods and fully-nonparametric neural networks in predicting yields of years withheld during model training. Using scenarios from a suite of climate models, we show large negative impacts of climate change on corn yield, but less severe than impacts projected using classical statistical methods. In particular, our approach is less pessimistic in the warmest regions and the warmest scenarios using CNN.

Keywords: Crop, semi parametric. Yield ,CNN.

How to Cite:

[1] Prof. Krishna S. Kadam, β€œCrop Yield Prediction Using CNN,” International Journal of Innovative Research in Electrical, Electronics, Instrumentation and Control Engineering (IJIREEICE), DOI: 10.17148/IJIREEICE.2024.12501

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