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International Journal of Innovative Research in Electrical, Electronics, Instrumentation and Control Engineering
International Journal of Innovative Research in Electrical, Electronics, Instrumentation and Control Engineering A monthly Peer-reviewed & Refereed journal
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← Back to VOLUME 5, ISSUE 3, MARCH 2017

A Study on System Reliability in Weibull Distribution

A. Ramesh Kumar, V. Krishnan

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Abstract: This paper presented the estimation of system reliability using two parameter Weibull distribution. The parameters are estimated using Weibull probability plot & statistical analysis and the results being presented in charts. An increasing complexity of systems often leads to an increase of failure mechanisms. A statistical analysis of the lifetime of systems with several failure mechanisms consisting of several subcomponents considered The Weibull distribution is commonly used as a lifetime distribution in reliability applications. The two-parameter Weibull distribution can represent a decreasing, constant or increasing failure rate.

Keywords: Reliability, Weibull distribution, WPP Method. MSC Code: 62EXX.

How to Cite:

[1] A. Ramesh Kumar, V. Krishnan, “A Study on System Reliability in Weibull Distribution,” International Journal of Innovative Research in Electrical, Electronics, Instrumentation and Control Engineering (IJIREEICE), DOI: 10.17148/IJIREEICE.2017.5308

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