Abstract: An Automatic test pattern generation technique using a pseudo-random number generator algorithm for testing combinational circuit is proposed. Rather than targeting a single fault pair at a time, the proposed System approach can distinguish multiple fault pairs in a single instance. For generation of automatic multiple non-repeating inputs which is used for testing the combinational circuit Pseudo-random generator can be used. New approaches are needed to reduce execution time and to improve fault coverage.
Keywords: PRNG-Pseudo-random number generator; ATPG; Algorithm; Testing; Fault distinguishing